Angular measurement of acoustic reflection coefficient for substrate materials and layered structures by V(z) technique - Université Polytechnique des Hauts-de-France Accéder directement au contenu
Article Dans Une Revue NDT & E International Année : 1997

Angular measurement of acoustic reflection coefficient for substrate materials and layered structures by V(z) technique

Résumé

An experimental method to evaluate the acoustic reflection coefficient as a function of the incident angle R(θ) for substrate materials or layered structures is presented. By measuring the acoustic material signature V(z) using a highly focused acoustic lens or transducer at normal incidence, the reflection coefficient R(θ) can be reconstructed from the FFT of the complex V(z) signal (amplitude and phase of the echo). This technique has a great simplicity for the experimental procedure of R(θ) measurement. It overcomes the disadvantages of the conventional method where the finite-aperture plane beam reduces the angular precision and causes the unexpected non-specular reflection at critical incident angles. Results are given for different substrate materials, single plates and a three-layered bonded joint, and are compared to theoretical predictions.

Dates et versions

hal-04081206 , version 1 (25-04-2023)

Identifiants

Citer

Wei-Jiang Xu, Mohamed Ourak. Angular measurement of acoustic reflection coefficient for substrate materials and layered structures by V(z) technique. NDT & E International, 1997, 30 (2), pp.75-83. ⟨10.1016/S0963-8695(97)85497-7⟩. ⟨hal-04081206⟩
9 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More