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Journal Articles Metrology Year : 2024

Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps

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hal-04544819 , version 1 (13-04-2024)

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Clement Moreau, Julie Lemesle, David Páez Margarit, François Blateyron, Maxence Bigerelle. Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps. Metrology, 2024, 4, pp.141 - 163. ⟨10.3390/metrology4020010⟩. ⟨hal-04544819⟩
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